i try replace new CYUSB3014-BZXC,not fix this;
Is there any good suggestion for my next step?
thk
QuickTest Log:
replace before(LimeSDR-Mini_0009081C05C42430.log)
[ TESTING STARTED ]
->Start time: Wed Aug 2 17:37:38 2023
->LimeSuite version: 20.10.0-g1480bfea
->Device: LimeSDR-USB, media=USB 2.0, module=FX3, serial=0009081C05C42430, index=0, HW=4, GW=2.23
Warning: USB3 not available
Serial Number: 0009081C05C42430
Chip temperature: 39 C
[ Clock Network Test ]
->FX3 GPIF clock test
Test results: 37435; 41191; 44947 - PASSED
->Si5351C test
CLK0: 17554 / 17554 - PASSED
CLK1: 17554 / 17554 - PASSED
CLK2: 17554 / 17554 - PASSED
CLK3: 17554 / 17554 - PASSED
CLK4: 17554 / 17554 - PASSED
CLK5: 17554 / 17554 - PASSED
CLK6: 17554 / 17554 - PASSED
->ADF4002 Test
Result: 10 - PASSED
->VCTCXO test
Results : 5112947 (min); 5113083 (max) - PASSED
->Clock Network Test PASSED
[ FPGA EEPROM Test ]
->Read EEPROM
->Read data: 01 00 00 1A B4 01 D5
->FPGA EEPROM Test FAILED
[ LMS7002M Test ]
->Perform Registers Test
->External Reset line test
Reg 0x20: Write value 0xFFFD, Read value 0xFFFD
Reg 0x20: value after reset 0x0FFFF
->LMS7002M Test PASSED
[ RF Loopback Test ]
Note: The test should be run without anything connected to RF ports
->Configure LMS
->Run Tests (TX_2-> LNA_L):
CH0 (SXR=800.0MHz, SXT=805.0MHz): Result:(-14.2 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=800.0MHz, SXT=805.0MHz): Result:(-16.9 dBFS, 5.00 MHz) - PASSED
->Run Tests (TX_1 -> LNA_W):
CH0 (SXR=1800.0MHz, SXT=1805.0MHz): Result:(-16.2 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=1800.0MHz, SXT=1805.0MHz): Result:(-19.6 dBFS, 5.00 MHz) - PASSED
->Run Tests (TX_2-> LNA_H):
CH0 (SXR=2500.0MHz, SXT=2505.0MHz): Result:(-15.7 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=2500.0MHz, SXT=2505.0MHz): Result:(-14.5 dBFS, 5.00 MHz) - PASSED
->RF Loopback Test PASSED
=> Board tests FAILED <=
Elapsed time: 8.36 seconds
replace after(programming )
LimeSDR-Mini_0009061F01151B30.log
[ TESTING STARTED ]
->Start time: Wed Aug 2 18:03:02 2023
->LimeSuite version: 20.10.0-g1480bfea
->Device: LimeSDR-USB, media=USB 2.0, module=FX3, serial=0009061F01151B30, index=0, HW=4, GW=2.23
Warning: USB3 not available
Serial Number: 0009061F01151B30
Chip temperature: 39 C
[ Clock Network Test ]
->FX3 GPIF clock test
Test results: 28731; 32487; 36243 - PASSED
->Si5351C test
CLK0: 17555 / 17554 - PASSED
CLK1: 17555 / 17554 - PASSED
CLK2: 17555 / 17554 - PASSED
CLK3: 17555 / 17554 - PASSED
CLK4: 17555 / 17554 - PASSED
CLK5: 17555 / 17554 - PASSED
CLK6: 17555 / 17554 - PASSED
->ADF4002 Test
Result: 10 - PASSED
->VCTCXO test
Results : 5112946 (min); 5113082 (max) - PASSED
->Clock Network Test PASSED
[ FPGA EEPROM Test ]
->Read EEPROM
->Read data: 01 00 00 1A B4 01 D5
->FPGA EEPROM Test FAILED
[ LMS7002M Test ]
->Perform Registers Test
->External Reset line test
Reg 0x20: Write value 0xFFFD, Read value 0xFFFD
Reg 0x20: value after reset 0x0FFFF
->LMS7002M Test PASSED
[ RF Loopback Test ]
Note: The test should be run without anything connected to RF ports
->Configure LMS
->Run Tests (TX_2-> LNA_L):
CH0 (SXR=800.0MHz, SXT=805.0MHz): Result:(-13.8 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=800.0MHz, SXT=805.0MHz): Result:(-17.0 dBFS, 5.00 MHz) - PASSED
->Run Tests (TX_1 -> LNA_W):
CH0 (SXR=1800.0MHz, SXT=1805.0MHz): Result:(-16.4 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=1800.0MHz, SXT=1805.0MHz): Result:(-18.6 dBFS, 5.00 MHz) - PASSED
->Run Tests (TX_2-> LNA_H):
CH0 (SXR=2500.0MHz, SXT=2505.0MHz): Result:(-14.9 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=2500.0MHz, SXT=2505.0MHz): Result:(-15.2 dBFS, 5.00 MHz) - PASSED
->RF Loopback Test PASSED
=> Board tests FAILED <=
Elapsed time: 9.05 seconds
[ TESTING STARTED ]
->Start time: Wed Aug 2 18:14:28 2023
->LimeSuite version: 20.10.0-g1480bfea
->Device: LimeSDR-USB, media=USB 2.0, module=FX3, serial=0009061F01151B30, index=0, HW=4, GW=2.23
Warning: USB3 not available
Serial Number: 0009061F01151B30
Chip temperature: 52 C
[ Clock Network Test ]
->FX3 GPIF clock test
Test results: 22587; 26343; 30099 - PASSED
->Si5351C test
CLK0: 17554 / 17554 - PASSED
CLK1: 17554 / 17554 - PASSED
CLK2: 17554 / 17554 - PASSED
CLK3: 17554 / 17554 - PASSED
CLK4: 17554 / 17554 - PASSED
CLK5: 17554 / 17554 - PASSED
CLK6: 17554 / 17554 - PASSED
->ADF4002 Test
Result: 10 - PASSED
->VCTCXO test
Results : 5112944 (min); 5113080 (max) - PASSED
->Clock Network Test PASSED
[ FPGA EEPROM Test ]
->Read EEPROM
->Read data: 01 00 00 1A B4 01 D5
->FPGA EEPROM Test FAILED
[ LMS7002M Test ]
->Perform Registers Test
->External Reset line test
Reg 0x20: Write value 0xFFFD, Read value 0xFFFD
Reg 0x20: value after reset 0x0FFFF
->LMS7002M Test PASSED
[ RF Loopback Test ]
Note: The test should be run without anything connected to RF ports
->Configure LMS
->Run Tests (TX_2-> LNA_L):
CH0 (SXR=800.0MHz, SXT=805.0MHz): Result:(-15.0 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=800.0MHz, SXT=805.0MHz): Result:(-18.1 dBFS, 5.00 MHz) - PASSED
->Run Tests (TX_1 -> LNA_W):
CH0 (SXR=1800.0MHz, SXT=1805.0MHz): Result:(-17.6 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=1800.0MHz, SXT=1805.0MHz): Result:(-20.0 dBFS, 5.00 MHz) - PASSED
->Run Tests (TX_2-> LNA_H):
CH0 (SXR=2500.0MHz, SXT=2505.0MHz): Result:(-16.4 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=2500.0MHz, SXT=2505.0MHz): Result:(-16.1 dBFS, 5.00 MHz) - PASSED
->RF Loopback Test PASSED
=> Board tests FAILED <=
Elapsed time: 8.80 seconds