Hello - I have a newly purchased LimeSDR usb; I followed the installation and firmware/gateware updates without issue, but the RF Loopback Test consistently fails; can anyone diagnose the following?
[ TESTING STARTED ]
->Start time: Thu Sep 12 20:07:51 2019->Device: LimeSDR-USB, media=USB 3.0, module=FX3, addr=1d50:6108, serial=00090726074D271A
Serial Number: 00090726074D271A[ Clock Network Test ]
->FX3 GPIF clock test
Test results: 31826; 35582; 39338 - PASSED
->Si5351C test
CLK0: 17554 / 17554 - PASSED
CLK1: 17554 / 17554 - PASSED
CLK2: 17554 / 17554 - PASSED
CLK3: 17554 / 17554 - PASSED
CLK4: 17554 / 17554 - PASSED
CLK5: 17554 / 17554 - PASSED
CLK6: 17554 / 17554 - PASSED
->ADF4002 Test
Result: 10 - PASSED
->VCTCXO test
Results : 5112949 (min); 5113092 (max) - PASSED
->Clock Network Test PASSED[ FPGA EEPROM Test ]
->Read EEPROM
->Read data: 12 0C 07 12 0C 07 02
->FPGA EEPROM Test PASSED[ LMS7002M Test ]
->Perform Registers Test
->External Reset line test
Reg 0x20: Write value 0xFFFD, Read value 0xFFFD
Reg 0x20: value after reset 0x0FFFF
->LMS7002M Test PASSED[ RF Loopback Test ]
Note: The test should be run without anything connected to RF ports
->Configure LMS
->Run Tests (TX_2-> LNA_L):
CH0 (SXR=800.0MHz, SXT=805.0MHz): Result:(-14.6 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=800.0MHz, SXT=805.0MHz): Result:(-16.6 dBFS, 5.00 MHz) - PASSED
->Run Tests (TX_1 → LNA_W):
CH0 (SXR=1800.0MHz, SXT=1805.0MHz): Result:(-18.0 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=1800.0MHz, SXT=1805.0MHz): Result:(-27.3 dBFS, 5.00 MHz) - FAILED
->Run Tests (TX_2-> LNA_H):
CH0 (SXR=2500.0MHz, SXT=2505.0MHz): Result:(-19.2 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=2500.0MHz, SXT=2505.0MHz): Result:(-15.9 dBFS, 5.00 MHz) - PASSED
->RF Loopback Test FAILED=> Board tests FAILED <=
Elapsed time: 1.51 seconds
That was the original test; now it will not even get that far, with it unable to conduct the RF Loopback tests at all:
[ TESTING STARTED ]
->Start time: Thu Sep 12 20:46:15 2019->Device: LimeSDR-USB, media=USB 3.0, module=FX3, addr=1d50:6108, serial=00090726074D271A
Serial Number: 00090726074D271A[ Clock Network Test ]
->FX3 GPIF clock test
Test results: 19707; 23463; 27219 - PASSED
->Si5351C test
CLK0: 17555 / 17554 - PASSED
CLK1: 17555 / 17554 - PASSED
CLK2: 17555 / 17554 - PASSED
CLK3: 17555 / 17554 - PASSED
CLK4: 17555 / 17554 - PASSED
CLK5: 17555 / 17554 - PASSED
CLK6: 17555 / 17554 - PASSED
->ADF4002 Test
Result: 10 - PASSED
->VCTCXO test
Results : 5112952 (min); 5113094 (max) - PASSED
->Clock Network Test PASSED[ FPGA EEPROM Test ]
->Read EEPROM
->Read data: 12 0C 07 12 0C 07 02
->FPGA EEPROM Test PASSED[ LMS7002M Test ]
->Perform Registers Test
->External Reset line test
Reg 0x20: Write value 0xFFFD, Read value 0xFFFD
Reg 0x20: value after reset 0x0FFFF
->LMS7002M Test PASSED[ RF Loopback Test ]
Note: The test should be run without anything connected to RF ports
->Configure LMS
SetPllFrequency: error configuring phase
SetPllFrequency: error configuring phase
SetPllFrequency: error configuring phase
SetPllFrequency: error configuring phase
SetPllFrequency: error configuring phase
SetPllFrequency: error configuring phase
SetPllFrequency: error configuring phase
SetPllFrequency: error configuring phase
SetPllFrequency: error configuring phase
SetPllFrequency: error configuring phase
LML TX phase search FAIL
Failed to set sample rate
->RF Loopback Test FAILED=> Board tests FAILED <=
Elapsed time: 1.47 seconds
Any idea what could be going on?