QuickTest Failure (LimeSDR-USB)

I purchased a LimeSDR-USB with aluminum case in late October and it is intermittently failing the quicktest, consistently on the TX_1 -> LNA_W loopback test. If I run the quicktest when the unit is first plugged in, it passes albeit with low-ish signal. However, as the unit comes up to temperature it fails consistently. This also coincides with not be able to use the LimeSuite auto-calibration (fails with error when attempted) leading me to think the unit is generally defective. Since the 90-day warranty window is at the end of January, I’d like to determine a path forward. Failing log is listed below. Thanks for the help!

Gateware version mismatch!
Expected gateware version 2, revision 17
But found version 2, revision 21
Follow the FW and FPGA upgrade instructions:
Or run update on the command line: LimeUtil --update

->Device: LimeSDR-USB, media=USB 3.0, module=FX3, serial=00090726074D041A, index=0
Serial Number: 00090726074D041A

[ Clock Network Test ]
->FX3 GPIF clock test
Test results: 26409; 30165; 33921 - PASSED
->Si5351C test
CLK0: 17554 / 17554 - PASSED
CLK1: 17554 / 17554 - PASSED
CLK2: 17554 / 17554 - PASSED
CLK3: 17554 / 17554 - PASSED
CLK4: 17554 / 17554 - PASSED
CLK5: 17554 / 17554 - PASSED
CLK6: 17554 / 17554 - PASSED
->ADF4002 Test
Result: 10 - PASSED
->VCTCXO test
Results : 5112940 (min); 5113078 (max) - PASSED
->Clock Network Test PASSED

->Read data: 12 0C 06 12 0C 06 03

[ LMS7002M Test ]
->Perform Registers Test
->External Reset line test
Reg 0x20: Write value 0xFFFD, Read value 0xFFFD
Reg 0x20: value after reset 0x0FFFF
->LMS7002M Test PASSED

[ RF Loopback Test ]
->Configure LMS
->Run Tests (TX_2-> LNA_L):
CH0 (SXR=800.0MHz, SXT=805.0MHz): Result:(-15.6 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=800.0MHz, SXT=805.0MHz): Result:(-16.1 dBFS, 5.00 MHz) - PASSED
->Run Tests (TX_1 -> LNA_W):
CH0 (SXR=1800.0MHz, SXT=1805.0MHz): Result:(-17.2 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=1800.0MHz, SXT=1805.0MHz): Result:(-21.7 dBFS, 5.00 MHz) - FAILED
->Run Tests (TX_2-> LNA_H):
CH0 (SXR=2500.0MHz, SXT=2505.0MHz): Result:(-16.6 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=2500.0MHz, SXT=2505.0MHz): Result:(-14.1 dBFS, 5.00 MHz) - PASSED
->RF Loopback Test FAILED

=> Board tests FAILED <=

Tester software settings are optimized for cold board this is why you get different result when checking hot board.