Limesdr-usb board test multiple failures

I have tried updating board, not sure if I need to buy a new one?

$ LimeQuickTest
[ TESTING STARTED ]
->Start time: Wed Aug 19 06:12:50 2026
->LimeSuite version: 20.10.0-PothosSDR-2021.07.25-vc16-x64

->Device: LimeSDR-USB, media=USB 3.0, module=FX3, serial=0009060B00472A22, index=0, HW=4, GW=2.23
Serial Number: 0009060B00472A22
Chip temperature: 41 C

[ Clock Network Test ]
->FX3 GPIF clock test
Test results: 29883; 33639; 37395 - PASSED
->Si5351C test
CLK0: 17554 / 17554 - PASSED
CLK1: 17554 / 17554 - PASSED
CLK2: 17554 / 17554 - PASSED
CLK3: 17554 / 17554 - PASSED
CLK4: 17554 / 17554 - PASSED
CLK5: 17554 / 17554 - PASSED
CLK6: 17554 / 17554 - PASSED
->ADF4002 Test
Result: 10 - PASSED
->VCTCXO test
Results : 5112978 (min); 5113107 (max) - PASSED
->Clock Network Test PASSED

[ FPGA EEPROM Test ]
->Read EEPROM
->Read data: 2F 28 00 EB 00 00 A0
->FPGA EEPROM Test FAILED

[ LMS7002M Test ]
->Perform Registers Test
->External Reset line test
Reg 0x20: Write value 0xFFFD, Read value 0xFFFD
Reg 0x20: value after reset 0x0FFFF
->LMS7002M Test PASSED

[ RF Loopback Test ]
Note: The test should be run without anything connected to RF ports
->Configure LMS
->Run Tests (TX_2-> LNA_L):
CH0 (SXR=800.0MHz, SXT=805.0MHz): Result:(-14.6 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=800.0MHz, SXT=805.0MHz): Result:(-16.8 dBFS, 5.00 MHz) - PASSED
->Run Tests (TX_1 → LNA_W):
CH0 (SXR=1800.0MHz, SXT=1805.0MHz): Result:(-36.7 dBFS, 5.00 MHz) - FAILED
CH1 (SXR=1800.0MHz, SXT=1805.0MHz): Result:(-23.9 dBFS, 5.00 MHz) - FAILED
->Run Tests (TX_2-> LNA_H):
CH0 (SXR=2500.0MHz, SXT=2505.0MHz): Result:(-16.2 dBFS, 5.00 MHz) - PASSED
CH1 (SXR=2500.0MHz, SXT=2505.0MHz): Result:(-14.4 dBFS, 5.00 MHz) - PASSED
->RF Loopback Test FAILED

=> Board tests FAILED <=

Elapsed time: 6.77 seconds

Looks like there may have been some damage on LNA_W input, but LNA_L and LNA_H inputs are still in spec. Which Rx inputs have you been using?

I found the balun is bad. Ordered a new one.

Thank you very much,

Ed