Ok, I tried it while the device was cold and had no antennas plugged in. (Previously I had the two stubby antennas that came with it screwed onto the device). This time the QuickTest passed. I left it plugged into the computer and tried the same QuickTest again after 6 minutes and now it’s back to failing.
So, I’m new to this but generally if a device cannot reliably pass it’s own hardware test, I’d consider it a faulty device. If this is a heat issue I’d still argue it’s a faulty device as it doesn’t feel warm enough to warrant a failure. Especially since it’s not actually doing anything but running the quicktest.
If I unplug the LimeSDR Mini and let it cool down I’ll get a few passes until it gets a little bit warm then it starts to fail consistently. When I say warm, it’s just barely “warm” enough to tell it’s not “cold” this is nowhere close to being hot when it starts to fail.
[ TESTING STARTED ]
->Start time: Thu May 7 20:03:16 2020
->Device: LimeSDR Mini, media=USB 3, module=FT601, serial=1D4C28EDDF0C2A, index=0
Serial Number: 1D4C28EDDF0C2A
[ Clock Network Test ]
->REF clock test
Test results: 48907; 62104; 9765 - PASSED
->VCTCXO test
Results : 6710980 (min); 6711138 (max) - PASSED
->Clock Network Test PASSED
[ FPGA EEPROM Test ]
->Read EEPROM
->Read data: 13 02 0C 13 02 0C 02
->FPGA EEPROM Test PASSED
[ LMS7002M Test ]
->Perform Registers Test
->External Reset line test
Reg 0x20: Write value 0xFFFD, Read value 0xFFFD
Reg 0x20: value after reset 0x0FFFF
->LMS7002M Test PASSED
[ RF Loopback Test ]
->Configure LMS
->Run Tests (TX_2 -> LNA_W):
CH0 (SXR=1000.0MHz, SXT=1005.0MHz): Result:(-12.4 dBFS, 5.00 MHz) - PASSED
->Run Tests (TX_1 -> LNA_H):
CH0 (SXR=2100.0MHz, SXT=2105.0MHz): Result:(-12.7 dBFS, 5.00 MHz) - PASSED
->RF Loopback Test PASSED
=> Board tests PASSED <=
Elapsed time: 5.49 seconds
[ TESTING STARTED ]
->Start time: Thu May 7 20:09:23 2020
->Device: LimeSDR Mini, media=USB 3, module=FT601, serial=1D4C28EDDF0C2A, index=0
Serial Number: 1D4C28EDDF0C2A
[ Clock Network Test ]
->REF clock test
Test results: 26862; 40059; 53256 - PASSED
->VCTCXO test
Results : 6710996 (min); 6711153 (max) - PASSED
->Clock Network Test PASSED
[ FPGA EEPROM Test ]
->Read EEPROM
->Read data: 13 02 0C 13 02 0C 02
->FPGA EEPROM Test PASSED
[ LMS7002M Test ]
->Perform Registers Test
->External Reset line test
Reg 0x20: Write value 0xFFFD, Read value 0xFFFD
Reg 0x20: value after reset 0x0FFFF
->LMS7002M Test PASSED
[ RF Loopback Test ]
->Configure LMS
->Run Tests (TX_2 -> LNA_W):
CH0 (SXR=1000.0MHz, SXT=1005.0MHz): Result:(-57.1 dBFS, -2.46 MHz) - FAILED
->Run Tests (TX_1 -> LNA_H):
CH0 (SXR=2100.0MHz, SXT=2105.0MHz): Result:(-13.1 dBFS, 5.00 MHz) - PASSED
->RF Loopback Test FAILED
=> Board tests FAILED <=
Elapsed time: 6.22 seconds
– Additional Edit –
If I blast the device with a high power fan to keep the temperature down, it will pass the test several times more than without the fan before it starts to fail (and fails while the Aluminum case is cold to the touch because of the fan).
If I remove the board from the Aluminum case and blast the board directly with the high powered fan it seems to pass the QuickTest consistently. Got tired of trying to make it fail in this config.
Conclusion: This thing is hyper-sensitive to any temperature increase. The Aluminum case looks nice but actually holds in the heat and contributes to the failure problem.